We introduce to the market first
of many TANGO Probes.
Our probes are designed to
simplify AFM electrical models
measurement by giving you the
benefit of full metal probes.
They wear off, but maintain its
electrical conductivity.
Perfect probes for KPFM,
C-AFM, SSRM and PEM.
standard probes
TANGO Probes
Our new probes are done out
of pure metal, so in principle
you can obtain higher
conductivity in comparison to
standard probes with thin
electrical conductive layer. Since there is no layer they are
mechanically more stable so
you can also apply higher
force during imaging.
Our probes have standard chip
layout so they fit any AFM
on the market.
Our probes are made out of different metals, you can choose right one for you when ordering.
Did you know that work function in KPFM will be different depending of your probe material?
Gold
Nickiel
Silver
See the difference
Try them
order now!
Contact

Contact

TANGO Probes are innovative probes for atomic force microscopes that will allow you to precisely perform standard measurements such as surface topography measurement, lateral force measurement and measurement using the Kelvin probe method. Thanks to the proposed production method, it will be possible to produce probes from any material that can be deposited by galvanic deposition or PVD methods. This technology also enables the production of any convex shape of the measuring tip of the probes.

Specification

Specification

TANGO Probes are innovative probes for atomic force microscopes that will allow you to precisely perform standard measurements such as surface topography measurement, lateral force measurement and measurement using the Kelvin probe method. Thanks to the proposed production method, it will be possible to produce probes from any material that can be deposited by galvanic deposition or PVD methods. This technology also enables the production of any convex shape of the measuring tip of the probes.

TECHNICAL DATA